Magnum 7
High Performance Flash Final Test for Today and Tomorrow
Teradyne’s Magnum 7 is intelligently designed to test the latest generation of NAND flash devices. High speed flash devices are enabling the next generation of UFS and PCIe applications. The AI revolution is fueled by massive amounts of data stored on high performance data center SSD’s and next generation AI PC’s, laptops and mobile devices. Magnum 7’s largest configuration delivers up to 18,432 I/O channels at 5.28Gbps per channel.
![Magnum 7_SSV+ Magnum 7](https://sp-ao.shortpixel.ai/client/to_webp,q_glossy,ret_img/https://www.teradyne.com/wp-content/uploads/2024/06/Magnum7_SSV-right-1024x893.jpg)
Advantages
High Performance
With 5.28Gbps digital channels, Magnum7 is designed to test current and future generation NAND devices. With support for both ONFI and separate command/address (SCA) interfaces, Teradyne aims to meet performance requirements for years to come.
High Parallelism
The Magnum 7 GV can be configured for up to 18,432 I/O’s, up to 4,096 DUT power supply (DPS) channels and up to 4,096 high voltage (HV) pins. With Teradyne’s superior signal per volume efficiency, up to 1,024 devices can be tested at one time.
High Current PMU
Magnum 7’s massively parallel high current PMU enables measuring low resistance parameters in minimum time.
Scalable
The Magnum family of testers comes in a variety of configurations, all using the exact same hardware and software. The engineering focused EV supports as few as 4 tester sites. The mid sized SSV+ supports up to 96 tester sites, while the maximum parallelism GV supports up to 128 tester sites. Development work done on an EV can be deployed directly to a production SSV+ or GV.
Reduced Test Time
Teradyne’s proprietary Fail List Stream (FLS) combined with hardware accelerated parameter sweeping can reduce test time by up to 25%. The uniquely powerful and adaptable pattern generator employed by Magnum 7 combined with our application team’s proven track record of innovation delivers capability unrivaled in the memory test industry.
Configurations
Magnum 7 EV
- Self- contained, low-power engineering test system, configurable with up to 1,152 digital pins and up to 256 DUT power supply (DPS) and high voltage (HV) channels.
- Tester interface units (TIUs) are available for mating to industry standard 512 and 768 parallel handlers.
- Device specific adapters (DSAs) and test programs are fully compatible across all configurations of Magnum 7.
Magnum 7 SSV+
- High volume production test system for final test applications, configurable with up to 13,824 digital pins and 3,072 DPS and HV channels.
- TIUs are available for mating to industry standard 512 and 768 parallel handlers.
- DSAs and test programs are fully compatible with EV and GV configurations.
Magnum 7 GV
- High volume production test system for final test applications, configurable with up to 18,432 digital pins and 4,096 DPS and HV channels.
- TIUs are available for mating to industry standard 512 and 768 parallel handlers.
- DSAs and test programs are fully compatible with EV and SSV+ configurations.
Software
All Magnum 7 configurations, in fact all Magnum testers, share interoperable Teradyne test development and debug tools allowing seamless collaboration between different platforms. Test programs are written for a single device then cloned across the available hardware automatically, simplifying the development process. The suite of debug tools is also site aware, allowing isolation of a problem device quickly and efficiently, and smoothing the transition from new product introduction to high volume manufacturing.