Mixed Technology Test Systems | Teradyne

Mixed-Technology Test Systems

Integrated Advanced Test Capabilities for Missile, Radar, Electronic Warfare, and Space Applications

Address complex test requirements of today’s advanced electronics with Teradyne’s integrated and scalable Mixed-Technology test systems – a single test solution that saves time, increases efficiency, and maximizes your return on investment.

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Mixed-Technology Testing for Modern Aerospace and Defense Electronics

Modern aerospace and defense electronics have become highly sophisticated and increasingly integrated. Testing multiple technologies on a Unit Under Test (UUT) with mission-specific test systems is often inefficient and can lead to high cost of operation and maintenance.

Teradyne’s Mixed-Technology Test Systems address complex test challenges while offering a simplified, scalable, and cost-effective approach to testing in various manufacturing and product support environments.

Capabilities

Teradyne’s Mixed-Technology test systems are built on Teradyne’s standard, open architecture Spectrum test platforms, with integrated advanced test capabilities including:

  • High speed digital bus tests
  • Real-time storage and processing of high-bandwidth, streaming data
  • Optical interfaces
  • Complex digital/optical switching
  • Precision analog
  • RF instruments and subsystems
  • High fidelity automated RF switching

Scalability

Teradyne’s mixed-technology test solution is highly scalable. System flexible sizing and compatibility across platforms provide cost-effective approaches to handling multiple programs at multiple production and depot sites.

Advantages

  • Tests various advanced technologies with one test system
  • Increases test and TPS development efficiency. Reduces procurement, operation and maintenance costs
  • Reduces schedule risk and overhead cost with single trusted vendor
  • Maximizes return on investment with system scalability and long-term supportability
  • Teradyne can deliver Complete test solutions that solve any test-related problems