Fail log capture and analysis is necessary and very important in almost every program Functional debugging, sometimes a small batch production fail log will have to be collected, to make a tradeoff analysis. The traditional solution is to get data from HRAM or CMEM, such as SFP of Teradyne J750 and UltraFLEX; most competitors ATE platform adopt a similar way. It is less efficient and difficult to use in production, test time is a key constraint. But for the Teradyne latest SOC tester UltraFLEXplus, we have another choice. The new structure UltraFLEXplus is not only evidenced by high instrument performance and huge broadside layout area, but also the data log flow and analysis. When UltraFLEXplus writes data to STDF file, it also has an interface to copy any data (fail log included) and transfer it to user, binding with algorithm, customer can make any analysis in real time.it almost will not take additional test time. In this paper, UltraFLEXplus data consumer structure and Scan falcon simple application case will be introduced, to make the customized output as customer’s requirements, such as single test item loops and site parallel output. Scan falcon can save a lot of test time, even if it is mainly targeted for debugging. Furthermore, if customers may also want to do some basic fail log analysis for production, Archimedes will be recommended, especially the potential benefit of big digital device testing. The strengths and weaknesses comparations between Scan Falcon， Archimedes real time analysis and extract fail cycle from STDF after end lots, will also be showed to audience.