Emerging markets are driving the evolution of discrete power devices. Increased power requirements mean more power is being driven through a smaller device, creating challenges in both device design and test. Our video series, 3 for 3, provides 3 answers for 3 pressing questions about trends in semiconductor test. Today Tom Tran, Product Manager for Power Discrete, discusses how testing for high power discrete devices is evolving. Contact us if you’re interested in learning more.
The video is only visible when the Allow all cookies option has been selected. To reset your cookie selection, clear your browsing history for this session and reload the page, or open this link in a private browser window and choose Allow all cookies. Thanks for your understanding while we resolve this issue.
Tom Tran is a Product Manager for Power Discrete Test at Teradyne. With over 15 years of test development experience in power management, precision analog and mixed signal semiconductors, Tom has been instrumental in the success of many projects on Teradyne’s ETS platform. Prior to his role as a Product Manager, Tom was a Field Product Specialist, who contributed to the successful adoption of Teradyne’s power discrete testers for wafer sort and power module testing at several customer sites around the world. Tom holds a BSEE from the University of Arizona.