eDigital-Series™ Digital Test Instrumentation

Defense and aerospace boxes and board designs frequently use low voltage TTL (LVTTL) and/or low voltage differential signaling (LVDS) technologies and often require boundary scan and parallel I/O flash programming test capability. eDigital-Series instruments provide flexible, parallel digital functional test for units under test (UUTs) employing logic voltages between -2V to +6V. Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing and voltage levels, data formats, pattern data, and timing alignment on 32 channels with up to 16M pattern depth and results memory.  Systems can achieve up to 544 synchronized channels using Teradyne’s Contact Free Air-Coupled Signal Technology (CFAST) using the newest instruments in the eDigital-Series. eDigital-Series instruments also capitalize on the boundary scan, parallel I/O, and flash programming capabilities, which are often included on these newer UUTs. Packaged in a compact PXIe form factor, eDigital-Series instruments may be used as a standalone instrument or configured as part of an integrated HSSub system.